Contact mode probes
The force apply on the surface is directly correlated to the spring constant of the cantilever : lowest spring constant = lowest force
Contact mode : A probe of nanometric size scans the surface using piezoelectric motors. Laser detection maintains a constant bending of the cantilever during the measurement. The movements of the vertical piezoelectric motor are recorded vertical to reconstruct the surface. Mapping of friction is performed with the torsion of the cantilever (LFM).
Oscillating mode probes
Highest resonance frequency = highest scan speed
The force apply on the surface is directly correlated to the spring constant of the cantilever : lowest spring constant = lowest force
Oscillating mode : A tip vibrating at its resonant frequency sweeps the surface using piezoelectric motors. Laser detection maintains the amplitude of oscillation constant during the measurement. The movements of the vertical piezoelectric motor are recorded to reconstruct the surface. Mapping of mechanical properties is achieved with the offsets of the phase signal. (phase contrast).
ResiScope/ Conductive/ PFM modes probes
Use highest spring constant as possible without damaging the sample.
– Diamond probes are dedicated for hard material.
– Low ROC (radius of curvature) diamond probes are used for high resolution
– Metal coating are dedicated for soft material
Soft ResiScope mode probes
A medium resonant frequency probe is necessary for soft resiscope mode. Metal coating and diamond probes can be use depending on sample material.
Soft ResiScope mode is an intermittent mode. The AFM probe only stays in contact with the sample during a short period of time with a constant force control which allows the ResiScope II to measure the resistance and the current in the best conditions for quantitative measurements. Then the tip is retracted and moves to the next step
Force Modulation mode probes
Force modulation mode is compatible with all AFM contact mode probes. Results depends of mechanical properties of the sample surface.
Force modulation is an AFM mode where probe properties of materials are understood through tip and sample interactions. The tip is oscillated at a high frequency and pushed into the repulsive regime where the force-distance curve can be measured and correlated to sample elasticity. The modulation data can be acquired in tandem with topography, allowing for comparison of both height and material properties.
Magnetic Force Microscopy mode probes
MAGT probes are dedicated for standard MFM measurements.
MAGT-LM & MAGT-HM probes are usefull for specific measurements.
MFM is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.
Specifics Probes
CSInstruments distributes a wide range of SPM probes for most AFM applications at an affordable price. We leverage our experience in AFM to provide the highest quality probes using the latest technology on the market.
CSI also distributes for speciality applications specific AFM probes such as colloidal probes, super sharp, or calibration grids and much more …
Liquid mode probes
Measurements in liquid can be done with all contact mode probes. Spring constant around 2.8 N/m can be use for oscillating mode in liquid (FORTA for example).
Temperature mode probes
Measurement under temperature control can be done with all oscillating & contact modes probes.
EFM/ KFM/ HD-KFM modes probes
A low frequency metal coating is recommended for EFM/ KFM/ HD-KFM modes. But low frequency diamond probes can be used if ResiScope measurements is considered
