Nano-Observer AFM
PRODUCER: CSI INSTRUMENTS
Best cost effective solution
The Nano-Observer AFM microscope is a flexible and powerful AFM. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (phase detection, Piezo-Response Mode…).
A low-noise laser and a pre-alignment system provide simplicity and high resolution on a compact AFM head. Its intuitive software simplifies all Atomic Force Microscope settings to allow quick and safe AFM acquisitions.
Compact and robust, the Nano-Observer Atomic Force Microscope fulfills the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorized control, makes the pre-approach easy.
Applications
- Material characterization
- Polymer science
- Electrical characterization
- Semiconductor
- Soft sample
- Biology
| XY scan range | 100 μm (tolerance +/- 10%) |
| Z range | 15 μm (tolerance +/- 10%) |
| XY drive resolution | 24 bit control – 0.06 Angströms |
| Z drive resolution | 24 bit control – 0.006 Angströms |
| Ultra low noise HV | Typ : <0.01 mV RMS |
| 6 DAC Outputs | 6 D/A Converters – 24 bit (XYZ drive, bias, aux…) |
| 8 ADC Inputs | 8 A/D Converters – 16 bit |
| Data points | Up to 8192 |
| Integrated Lock-in | Up to 6 MHz (software limited) 2nd lock-in (6 MHz-optional) |
| Interface | USB (2.0 – 3.0 compatible) |
| Controller Power | AC 100 – 240 V – 47-63 Hz |
| Operating System | Windows 7 to 10 |
